eBook For Reliability Prediction for Microelectronics 1st Edition
Why Choose US?
- This product is a digital eBook. It is not a printed book. No item will be sent to your home.
- After you buy, you will get a file that you can download right away. You can open and read the eBook on your phone, tablet, laptop, or computer.
- Our digital books are easy to download and simple to use. You can save the file and read it anytime you want.
- If you have any problems with your download, please contact us. Our support team is available all day and night to help you.
- If you cannot find the eBook you need in our store, please contact us. We’ll find that book for you and arrange it as soon as possible.
- Thank you for visiting our store and choosing our digital products. Enjoy your reading.
Table of Contents
Author Biography xiii
Series Foreword xv
Preface xix
Scope xxi
Introduction xxiii
1 Conventional Electronic System Reliability Prediction 1
1.1 Electronic Reliability Prediction Methods 2
1.2 Electronic Reliability in Manufacturing, Production, and Operations 27
1.3 Reliability Criteria 34
1.4 Reliability Testing 42
2 The Fundamentals of Failure 55
2.1 The Random Walk 56
2.2 Diffusion 61
2.3 Solutions for the Diffusion Equation 63
2.4 Drift 69
2.5 Statistical Mechanics 70
2.6 Chemical Potential 74
2.7 Thermal Activation Energy 77
2.8 Oxidation and Corrosion 81
2.9 Vibration 85
2.10 Summary 89
3 Physics-of-Failure-based Circuit Reliability 91
3.1 Problematic Areas 92
3.2 Reliability of Complex Systems 113
3.3 Physics-of-Failure-based Circuit Reliability Prediction Methodology 119
4 Transition State Theory 133
4.1 Stress-Related Failure Mechanisms 134
4.2 Non-Arrhenius Model Parameters 138
4.3 Physics of Healthy 171
5 Multiple Failure Mechanism in Reliability Prediction 179
5.1 MTOL Testing System 183
5.2 MTOL Matrix: A Use Case Application 191
5.3 Comparison of DSM Technologies (45, 28, and 20 nm) 200
5.4 16 nm FinFET Reliability Profile Using the MTOL Method 204
5.5 16 nm Microchip Health Monitoring (MHM) from MTOL Reliability 215
6 System Reliability 229
6.1 Definitions 230
6.2 Series Systems 232
6.3 Weibull Analysis of Data 241
6.4 Weibull Analysis to Correlate Process Variations and BTI Degradation 247
7 Device Failure Mechanism 255
7.1 Time-Dependent Dielectric Breakdown 257
7.2 Hot Carrier Injection 265
7.3 Negative Bias Temperature Instability 276
7.4 Electromigration 282
7.5 Soft Errors due to Memory Alpha Particles 285
8 Reliability Modeling of Electronic Packages 289
8.1 Failure Mechanisms of Electronic Packages 293
8.2 Failure Mechanisms’ Description and Models 297
8.3 Failure Models 310
8.4 Electromigration 315
8.5 Corrosion Failure 317
8.6.1 Creep 322
8.7 Reliability Prediction of Electronic Packages 325
8.8 Reliability Failure Models 325
References 331
Index 363
Reviews
There are no reviews yet.